Dr. Dong-Lin Xie Board Certifications •   Anatomic and Clinical Pathology •   Dermatopathology Education •   Shanghai Medical University,      Shanghai, China Biography Dr. Xie is board certified in anatomic and clinical pathology, and dermatopathology. She received her medical degree from Shanghai Medical University and completed a residency in anatomic and clinical pathology at the Ohio State University in Columbus, Ohio, where she also completed fellowships in dermatopathology and transfusion medicine.   Dr. Xie was a clinical assistant professor at the University of Florida from 1999 to 2001.  She is a member of the College of American Pathologists, American Society of Clinical Pathology and the Florida Society of Pathologists. All Content © 2006, Reliance Pathology Partners, LLC